About the four probe test 50, about the four probe test

The email has been sent, please pay attention to check!

Attached: Table of correction coefficients:

Appendix 1a Sample thickness correction factor g(ws).

Sample thickness is thinner: WS = see Table 5

w: sample thickness (m): s:

Probe spacing (mm) w s w 0 1 2 3 4 5 6 7 8 9w s w 0 1 2 3 4 5 6 7 8 9w s w 0 1 2 3 4 5 6 7 8 9w s w 0 1 2 3 4 5 6 7 8 9 Appendix 1b Sample thickness correction factor g(ws).

Thicker sample thickness: WS = see table.

w: sample thickness (m): s: probe spacing (mm) w s

For more accurate measurements, please check the table below.

Appendix 2: Correction factor d(ds)1) for sample shape and measurement position of circular lamellae.

Diameter d(mm) probe position.

Position from the center of the circle Position from the edge position.

0 mm 1 4 d 5 mm 4 mm 3 mm 2 mm2) rectangular sheets.

Square Rectangle.

d s a d=1 a d=2 a d=3 a d 4d: the length of the short side.

a: The length of the long side.

s: probe spacing.

Four-probe test thickness correction table.

The four-probe testing technique, or four-probe method for short, is the most commonly used method for measuring the resistivity of semiconductors.

The four-probe test technology is to use 4 equally spaced probes to pierce the semiconductor surface, and the constant current source provides an appropriately small current i to the outer two probes, and then measure the voltage v between the circles of the two probes in the middle, and the resistivity of the semiconductor can be obtained.

For a thin semiconductor sheet with a thickness of w (much less than the length and width), the resistivity quiver is obtained as = w(v i), where is the correction factor. In particular, for thin semiconductor wafers with a diameter much larger than the probe spacing, the resistivity is = ln2)w(v i)= w(v i) [cm], where w is measured in cm.

The four-probe method refers to the promotion of effective communication and exchange through four aspects: open-ended inquiry, reverse inquiry, emotional comprehension and active intervention. Its advantages are as follows:

1.It helps to establish a real sense of interaction, better understand each other's ideas and needs, and achieve deeper communication.

2.The four-probe approach focuses on listening to and understanding the emotions and experiences of the other party, so as to better eliminate problems and contradictions in communication.

3.By actively intervening, we can better guide the development of dialogue and avoid the two sides falling into impasse or quarrels.

4.The four-probe method can also help people better understand themselves and further improve their communication skills and emotional intelligence through communication.

Summary. Kiss! Hello, a blessing, a warmth, a touch.

Have a grateful heart. Life is full of touching! Your question has been received, it will take a little time to type, please wait a moment and please do not end the consultation.

You can also take this time to provide more effective information so that I can better answer for you. Hope mine can solve your problem and sort out the answer for you right away, please wait a moment!

Kiss! Hello, a blessing, a warmth, a touch. Have a grateful heart.

Life is full of emotional impulses! Your question has been received, it will take a little time to type, please wait a moment and please do not end the consultation. You can also take this time to provide more effective information so that I can better answer for you.

I hope mine can solve your problem, and immediately sort out the answer for you, please wait for a while!

Hello, glad to answer for you. In the four-probe method, the test temperature will have a certain error on the accuracy of the test results. The four-probe method is usually used to measure the resistivity of a hand-stool semiconductor.

The four-probe method has a very big advantage of measuring resistivity, it does not require calibration; Sometimes the resistivity is measured with a coarse segment and the four-probe method is used for calibration.

Do you have any other questions? I can go on and on for you to answer 3I hope this service can help you, you can click on my avatar to follow me, and if you have any questions in the future, you can consult me again, and look forward to serving you again.

Wishing you well; Have a good life and all the best! 4.If you are satisfied with my service, please give a thumbs up, and I wish you all the best!

Peace and joy <>

Three Qi high temperature four probes.

The copy fixture is based on the electrical performance measurement of the four-probe bai

Method, and needle design for high temperature environment. It is composed of four independent probe adjustment devices, high temperature and high frequency probes, adjustment support frames, sample platforms, thermal insulation layers, and junction boxes.

The probe adjustment device has a three-dimensional precise adjustment function to accurately locate the position of the probe;

The probe adjustment device has a coarse adjustment function, which effectively increases the adjustment range of the probe;

The probe adjustment device has the function of probe pressure adjustment to ensure that the probe has good contact with the sample without damaging the sample;

The probe is designed with coaxial shielding to reduce electromagnetic interference to the measurement;

The probe electrode is made of platinum-iridium alloy, which effectively reduces the contact resistance and has good high-temperature oxidation resistance.

The four-probe method is commonly used to measure the resistivity of semiconductors. The four-probe method has a very big advantage of measuring resistivity, it does not require calibration; Sometimes resistivity is measured by other methods, and the four-probe method is used for calibration.

This means that you have to use an ohmic meter to measure directly. The ohmmeter generates a weak current on its own, measures the voltage at both ends of the probe, and then compares it with its own body resistance, and finally gives the resistance value. But this is inaccurate for semiconductors, and the main reason why semiconductor resistance cannot be measured with two probes is:

1 The influence of contact resistance is severe. The contact between the probe and the semiconductor produces a certain thickness of the depletion layer, the depletion layer is high resistance, and the contact between the probe and the semiconductor is not as good as that between the metal, and an additional resistance is generated, called the expansion resistance, both of which are contact resistances, usually very large. The smaller the actual resistance of semiconductors relative to them, the less accurate the measurements will be.

2 There is a low number of electrons.

Special method: Four-probe method, two probes input to measure the current, and the other two probes measure the voltage distribution.

If you understand the principles of galvanometers, voltmeters, and resistance meters, you can understand them better.

I really can't change it or look for the information of this model on the hard city.

It depends on what you're trying to measure. There are special testers and probes for measuring thin films, and the testers for measuring block rod materials and thin film materials can be universal, and you can change to a four-probe probe. There are two kinds of powder testers, including manual tester and electric tester.

This instrument is suitable for semiconductor material factories, semiconductor device factories, scientific research units, colleges and universities to test the resistance performance of semiconductor materials.

The Four-Probe Software Test System is a user-friendly program that runs on a computer with a user-friendly test interface, which assists users to easily perform various tests, obtain test data, and perform statistical analysis of test data.

The test program controls the four-probe tester to measure and collect test data, analyze the collected data in the computer, and then record and display the test data intuitively and graphically. Users can save or print the collected data in the computer for future reference and viewing, and can also output the collected data to Excel, allowing users to analyze the data for various purposes.