Atomic force microscopy AFM studies of several imaging modes are solved

0 Introduction7-8 1 Atomic Force Microscopy.

Several basic imaging modes for 8-23 Scanning Probe Microscopy (SPM) Development8-9 Scanning Tunneling Microscopy.

STM)9-11 Photon Scanning Tunneling Microscopy (PSTM)11-13 Physical Mechanisms of Photon Tunneling and PSTM11-12 How PSTM Works12 Characteristics of PSTM12-13 Applications of PSTM13 Atomic Force Microscopy (AFM)13-21 Physical Mechanisms of AFM14 How AFM Works14-16 Basic Imaging Modes of AFM16-20 Contact Mode of AFM16-17 Non-contact mode17-19 Tapping mode19-20 Expansion of AFM's capabilities20-21 References21-23 2 Phase imaging mode of atomic force microscopy23-35 Principle of phase imaging of atomic force microscopy and connotation of phase image23-24 Kinetic theory and phase difference of tip-sample interaction.

Discussion of the Relationship24-26 The Relationship between Phase and Energy Consumption in Tapping Mode Imaging26-29 Derivation of the Relationship between Phase Difference and Energy Consumption26-28 Discussion of the Results28-29 Implications of this Method29 Composed of a-p-z(amplitude.

Phase-tip-to-sample distance) curve selection scanning amplitude parameters29-30 Experimental results30-32 Conclusion32-33 Phase images of some other samples33-34 References34-35 3 Atomic forces Photon Scanning Tunneling Combined Microscopy (AF PSTM) Modes35-49 Atomic Forces Principles of Photon Scanning Tunneling Microscopy (AF PSTM)35-36 AF PSTM System Structure and Working Principles36-37 AF PSTM Experimental Data and Results37-47 Polylactic acid clan 37-39 Plasma treatment for E. coli 39-41 Shrimp gonads 41-45 Carp slices 45-47 Prospects for the industrialization of AF PSTM 47-48 References 48-49 4 Introduction to Pulsed Force Imaging Modes for Atomic Force Microscopy 49-57 Introduction 49-50 Instrumentation 50-51 Several Important Data Points in PFM 51-52 Measurement and Discussion52-54 Conclusion 54-55 References 55-57 5 Summary and Prospects57-58 Appendix: Introduction to CODY Imaging Mode (Combined Dynamic Mode) for Atomic Force Microscopy 58-68 Acknowledgments 68-71

The atomic force microscope (AFM) was designed in 1986 to obtain microscopic information about the surface of the sample by detecting the interatomic force between the needle tip and the sample, so the sample is not required to be electrically conductive. AFM works by fixing one end of a microcantilever that is very sensitive to weak forces, and the other end is equipped with a probe, and the tip of the needle is in gentle contact with the sample surface, and the very weak repulsion between the tip atoms and the atoms on the sample surface causes the microcantilever to bend upward. By detecting the change in the position of the laser light spot reflected from the back of the microcantilever on the optical detector, it can be converted into a change in force, because the change in the position of the reflected light spot or the change in the bending of the microcantilever is proportional to the change in force.

The bending of a microcantilever is the result of a combination of forces, the most common of which is the van de Wouwer force, which can be generated by a small change in the distance between the tip and the sample surface. By controlling the constant force of the tip during the scan, the longitudinal displacement of the tip is measured, and microscopic information of the sample surface can be obtained.

The AFM has two working modes: constant force mode and constant height mode. In constant force mode, the scanning head moves up and down vertically with the change of the surface morphology of the sample, and the force on the micro-holding microcantilever is constant, and the topography of the sample surface is obtained from the longitudinal movement of the scanning head.

In constant height mode, the height of the scan head is fixed, and the sample surface information is obtained directly from the deflection information of the microcantilever in space. SPM is quickly being used in life science research due to its high resolution and continuous and dynamic detection of microscopic information of objects in a variety of environments (vacuum, gas, and liquid). SPM was first used to study the structure and function of biological macromolecules (DNA, proteins, etc.), and a wealth of data has been accumulated in this regard.

The basic principle of atomic force microscopy (AFM) is that a microcantilever that is extremely sensitive to weak forces is fixed at one end and has a tiny needle tip at the other end, and the needle tip is in gentle contact with the sample surface, because there is a very weak repulsive force between the needle tip atoms and the atoms on the sample surface, by controlling the constancy of this force during scanning, the microcantilever with the needle tip will correspond to the isotope of the force between the needle tip and the atoms on the sample surface and move in the direction of undulation perpendicular to the surface of the sample. Choosing an AFM Recommendation Park NX-Hybrid NX-Hybrid WLI is the first-ever AFM with a built-in WLI profiler for semiconductor and related manufacturing quality assurance.

Examples include semiconductor front-end, back-end to advanced packaging process control, and R&D metrology. It is suitable for devices that require high-throughput measurements over large areas that can be scaled down to nanoscale regions with sub-nanometer resolution and ultra-high accuracy.

Advantages of NX-Hybrid WLI:

1. Park WLI system.

Park WLI supports WLI and PSI modes (PSI mode is supported by a motorized filter converter) with available objective magnifications X, 20X, 50X, 100X; The two objectives can be changed automatically by an electric linear lens changer.

2. WLI optical interferometry.

When scanning the height of the Mirau objective, the change in light intensity caused by interference can be used to calculate the sample surface height at each pixel; White light interferometry (WLI) and phase-shift interferometry (PSI) are two commonly used surface characterization techniques.

For more information about AFM, we recommend consulting PARK AFM. The Park AFM has a comprehensive scanning mode, so it can collect a wide range of data types accurately and efficiently; From using the world's only true non-contact mode to maintain probe sharpness and sample integrity, to advanced magnetic force microscopy, Park provides customers with the most innovative and precise modes in the field of atomic force microscopy. <>

The basic principle of atomic force microscopy (AFM) is that a microcantilever that is extremely sensitive to weak forces is fixed at one end and has a tiny needle tip at the other end, and the needle tip is in gentle contact with the sample surface, because there is a very weak repulsive force between the needle tip atoms and the atoms on the sample surface, by controlling the constancy of this force during scanning, the microcantilever with the needle tip will correspond to the isotope of the force between the needle tip and the atoms on the sample surface and move in the direction of undulation perpendicular to the surface of the sample. Using optical detection or tunneling current detection, the position of the microcantilever corresponding to each point of the scan can be measured, so that information on the surface topography of the sample can be obtained.

afmAtomic force microscopymanufacturers

1. Beijing Yicheng Hengda Technology ****.

Main Products: Universal Material Testing Machine, Fatigue Testing Machine, Impact Testing Machine, Electrochemical Workstation.

Potentiostat galvanostat, quartz crystal microbalance, three-dimensional morphology instrument.

95 Qinghe 3rd Street, 929 Tongyuan Building.

2. Marico (Shanghai) ******.

Main Products:Infrared Spectrometer.

NanoIR Nanoscale Multifunctional Infrared Spectroscopy System (NanoIR, Atomic Force Microscope (Upgradeable).

Room 2509, Building 28, No. 6999 Chuansha Road.

3. Taizhou Juna New Energy.

Main Products: 2D Materials, Testing Services, Imported Equipment.

4. Boyue Instrument (Shanghai) **** Chengdu Office.

Main Products: Step Meter, Step Meter Probe, AFM Probe, AFM Probe, AFM Probe, Veeco Probe, AFM Probe, Hastelloy, Hull.

Room 2625, 26th Floor, Block A.

5. The Han Electronics Department is like a ruler and skill.

Main Products:Chemical Products; industrial products; AFM probes; AFM standards; Atomic force microscope probes. Slag keys.

No. 900 Jinsui in Guangzhou Avenue Central.

AFM atomic force microscope manufacturers:

1. Beijing Yicheng Hengda Technology ****.

Main Products: Universal Material Testing Machine, Fatigue Testing Machine, Impact Testing Machine, Electrochemical Workstation, Constant Potentiostat Hengyu Huai Current Meter, Quartz Crystal Micro Balance, Three-dimensional Morphology Instrument.

2. Marico (Shanghai) ******.

Main Products: Infrared Spectrometer, NanoIR Multifunctional Infrared Spectroscopy System NanoIR, Atomic Force Microscope (Upgradeable Version), AFM+.

3. Taizhou Juna New Energy.

Main Products: 2D Materials, Testing Services, Imported Equipment.

4. Boyue Instrument (Shanghai) **** Chengdu Office.

Main Products:Step Meter,Step Meter Probe,AFM Probe,AFM Probe,VEECO Probe,AFM Probe,Hastelloy.

5. Hanshu Electronic Technology ****.

Main Products:Chemical Products; industrial products; AFM probes; AFM standards; Atomic force microscopy probe.

Fundamentals of AFM.

The basic principle of AFM is the denier type: a microcantilever that is extremely sensitive to weak forces is fixed at one end, and there is a tiny needle tip at the other end, and the needle tip is gently connected to the sample surface, because there is a very weak repulsive force between the needle tip atoms and the atoms on the sample surface, by controlling the constant force during scanning, the microcantilever with the needle tip will correspond to the isotope plane of the force between the needle tip and the atoms on the sample surface and move in the direction perpendicular to the surface of the sample. By using optical detection method or tunneling current detection method, the microcantilever can be measured to guess the change of the position mode starvation of each point of the scan, so that the surface topography of the sample can be obtained.

The principle of AFM is to make use of ().

a.Lifting and lowering of the sample surface.

b.Tunnel current.

c.Primary electrons.

d.Secondary electrons.

Correct car answer: the lifting of the surface of the sample closure positive difference.