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Anonymous users2024-02-07IC is the general term for semiconductor component products, IC can be divided into digital IC, analog IC, microwave IC and other ICs according to their functions, among them, digital IC is the most widely used and fastest-growing IC variety in recent years. Digital IC is an IC that transmits, processes, and processes digital signals, and can be divided into general-purpose digital IC and special-purpose digital IC.
As for the position, it's not very clear, but if you look at it from the English translation, it may mean the supervisor!
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Anonymous users2024-02-06IC is generally divided into two kinds of bare die and packaging wafer, generally speaking, bare die can not be opened in the general environment, stored in a clean room and has strict requirements for static electricity, after the arrival of IQC is just a large number of bags, and then handed over to a special storage room for preservation, try to use the freezer to preserve, humidity around 50%.
The packaging piece, generally can be used as a test board, on the test board to do some IC sockets (there is a monopoly) and then spot checks, if it is a large and regular company, it is another matter.
Find a product literature that we hope will be helpful to you.
IC test. Beijing: 13717605936.
1. Use: The manipulator is used to test or burn DIP, and the integrated circuit of SOP package contains SOP and SSOP; dip;tssop；Others are under development.
2. Features: There is a feed pipe, an OK discharge pipe and a fall discharge pipe, which is driven by an electromagnet to sort the edge to the OK Fail pipe.
There are three modes to choose from: automatic, OK test, and fail test.
There and pause modes are used for overhauling the machine and temporarily removing jamming, respectively.
The number of full pipes of the discharge pipe can be set freely by the customer.
The number of retests can be set by the user.
The high and low levels of the interface signal of the tester can be set by the user.
When the mechanical abnormality is abnormal, the LED will display the abnormality**, which is convenient for the user to troubleshoot.
The number of tests and the total number of tests for OK Fail can be displayed.
3. Attention to the order: The customer wants to provide IC samples and IC tubes (equipped with IC), and if you want to use it for testing, you need to provide a tester, and if you want to burn, you need to provide a burner.
Fourth, the test speed, depending on the product, is generally 2,000 hours, and other test fixtures are generally 8 hours and 2,000 PCB
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Anonymous users2024-02-05IC test socket (test socket) is a standard test equipment that tests the electrical properties and electrical connections of IC devices to check for manufacturing defects and defective components.
IC test socket design features:
The IC test socket uses a clamp shell top cover with a floating Z-axis pressure plate to provide package thickness tolerances.
Low, medium, and high-performance chip test probes.
The high-elasticity spring test probe is suitable for lead-free packaging.
Package pitches are as low as millimeters.
Encapsulation with irregular ejector pin position.
A heat sink can be built into the top cover or IC test dock base.
High-performance plastics as the base material.
Anodized aluminium top cover.
Each test socket can contain multiple test interfaces.
Lifespan 25000 plug-in use.
Electrical performance: up to 30GHz, -1dB loss.
3A current capacity.
Temperature range. 55°C+155°C, according to different test probes.
IC refers to IC chip.
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The following is a scattered piece of information on the Internet, which I have compiled. >>>More
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